Force modulation mode kit

Sales price 300 $
Nanosurf System
CoreAFM , Easyscan 2 AFM , FlexAFM , LensAFM , NaioAFM , NaniteAFM
Description

Force modulation imaging of SBR-PMMA polymer blend


Product information
Order number BT06354
Expected to ship within 2 days
Delivery contents
  • Cantilever PPP-ContSCR (3 pcs)
  • Polymer sample SBR-PMMA in vial
  • Pipette tips 200ul (5 pcs)
  • Mica on teflon on metal substrate
Prerequisites

Easyscan 2 controller: dynamic module and mode extensions module

NaioAFM: advanced modes option

Product details

The force modulation mode kit contains everything required to set up and perform force modulation AFM imaging. The kit includes a set of cantilevers and a polymer blend sample composed of styrene-butadiene-rubber (SBR) and poly(methyl methacrylate) (PMMA) that can be easily prepared on site to always start with a fresh and clean sample surface.

Topographic image of a SBR/PMMA surface prepared by drop deposition on freshly cleaved mica. The image size is 9 µm x 9 µm, the height scale is 220 nm.
Simultaneously acquired force modulation amplitude signal rendered on top of the sample topography. The cantilever was driven with a small excitation amplitude at its contact resonance frequency. Amplitude range: 45 mV.
Simultaneously acquired force modulation phase signal rendered on top of the sample topography. Phase range: 140 °

The SBRS-PMMA polymer blend sample provides a surface that allows abservation of both phase and amplitude differences between different phases of the sample. The size of the features may vary from preparation to preparation and depend on the way the sample is prepared.

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