Lateral Force Mode Kit

Sales price 338 US$
Nanosurf System

Measuring friction variations on a polymer-blend sample

Product information
Order number BT06347
Expected to ship within 2 days
Delivery contents
  • Cantilever Stat0.2LAuD (3 pcs)
  • Polymer sample SBS-PMMA in vial
  • Mica on Teflon® on metal substrate
  • Pipette tips 200 µl (5pcs)

Product details

The lateral force mode kit provides everything that is required to perform lateral force imaging with your AFM. The kit comes with a set of cantilevers and a polymer blend sample composed of poly(styrene-butadiene-styrene) (SBS) and poly(methyl methacrylate) (PMMA) that can be easily prepared on site to always start with a fresh and clean sample surface.

top row: topography in 3D (left) and 2D (right) representations
bottom row: processed lateral force signals
scan size 24.7 µm, height range 60 nm
top: schematic representation of sources for contrast in the lateral deflection signal
bottom: unprocessed (left) and processed (right) lateral deflection data; the blue line in the 2D topography image indicates the location of the line used in this figure

The SBS-PMMA polymer blend sample exhibits islands that vary in size from sub-micrometer to several micrometers in diameter. The islands show lower friction compared to the surrounding matrix. Depending on the preparation, also different levels of friction can be observed in the matrix, probably arising from different degrees of polymer unmixing during solvent evaporation.

Lateral deflection of the cantilever can be caused by either friction between the cantilever tip and the sample or by topography effects. To separate topography-induced from friction-induced lateral deflection, the average and difference between the forward and backward motion can be calculated (see scheme above). Using image post-processing the respective images can be calculated and mapped to the topography of the sample.

Without calibration of the lateral spring constant and sensitivity of the cantilever, only qualitative conclusions can be drawn from the lateral force images. Recently, Dziekonski et al. developed a MEMS microforce sensor for simple and direct measurement of the lateral force calibration constant.

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