An easy example to create and measure nanolithography structures with your AFM
|Expected to ship within
- Cantilever Dyn190Al (3 pcs)
- CD-ROM sample
The polycarbonate CD-ROM material is very suitable to be modified by scratching structures in static mode. In dynamic mode the sample can be imaged directly afterwards to view your structure.
The standard lithography operating modes include free vector objects drawing or real-time drawing by mouse on a previously recorded AFM image. You can choose between tip lift or force control during movement from point to point.