|Expected to ship within||2 days|
|Delivery contents||Software activation key|
|Device compatibility||Only for systems with C3000 controller|
This options activates the contour following mode with advanced AFM parameter settings. Contour following means that the topography measured in a first pass is followed at constant separation between tip and sample in a second pass. This option is particularly useful for MFM, EFM and KPFM. Advanced parameter settings during the second pass include dark mode, with the laser switched off or different oscillation amplitude of the cantilever. If the KPFM work package is available, its feedback parameters can be set independently from the first pass.