C3000 KPFM work package
Sales price 1'658 US$
Description
Add KPFM measurement capabilities to your AFM
IMPORTANT: When ordering products including software, it is required that you mention the serial number of your controller in the "Notes & special requests" field on the cart page before finalizing your order.
| Product information | |
|---|---|
| Order number | BT06140 |
| Expected to ship within | 2 days |
| Delivery contents | Software activation key |
| Device compatibility | Only for systems with C3000 Controller |
| Prerequisites | C3000 advanced modes option |
Product details
This option activates the Kelvin-Probe Force Microscopy (KPFM) control panel in the software. KPFM can be used to image surface contact potential differences simultaneously with the dynamic mode sample topography or interlaced with the topography with the tip lifted from the surface.
KPFM measurements can also be made in spectroscopy mode (contact potential versus distance, versus user output). Contact us for more details or view a few examples on the Nanosurf website.
The EFM mode kit and advanced modes options further enhance your system, providing a demonstration sample and contour following option, respectively.
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