|Expected to ship within||2 days|
|Delivery contents||Software activation key|
|Device compatibility||Only for systems with C3000 Controller|
|Prerequisites||C3000 advanced modes option|
This option activates the Piezoresponse Force Microscopy (PFM) control panel in the software. For PFM the topography is measured in static mode, while the piezo response is monitored by the second lock-in amplifier. The magnitude of the response is derived from the amplitude and the direction from phase of a mechanical cantilever oscillation induced by an AC voltage applied to the tip.