|Expected to ship within||2 days|
|Delivery contents||Software activation key|
|Prerequisites||Naio dynamic modes option|
This options adds functionality to do more advanced spectroscopy, for example to analyze mechanical properties of a sample or adhesion forces.
For the NaioAFM compared to standard spectroscopy it allows cantilever and individual configurations of the distinct phases of spectroscopy (like movement to and from the sample and pauses). Both NaioAFM and NaioSTM benefit from the “stop by value” triggering that can move the tip to the surface until a well-defined tip-sample trigger threshold. The number of spectroscopy data positions is not software limited. The cantilever spring constant calibration is based on the Sader method, using the resonance detection from a frequency sweep.
Wizards are available for easily setting up the spectroscopy measurements and the deflection sensitivity calibration.